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Electromagnetic wave scattering from real‐life rough‐surface profiles and profiles based on an averaged spectrum
Author(s) -
Tsang Leung,
Pak Kyung,
Weeks Robin,
Shi Jian Chen,
Rott Helmut
Publication year - 1996
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19960805)12:5<258::aid-mop4>3.0.co;2-9
Subject(s) - scattering , spectral density , surface (topology) , computational physics , cross section (physics) , rough surface , physics , spectrum (functional analysis) , optics , power law , spectral line , mathematics , materials science , geometry , quantum mechanics , statistics , composite material
We investigate random rough‐surface scattering with surface profiles of three different kinds. For each surface profile we calculate the scattering cross section exactly, and the average scattering cross section is taken over realizations. In the first method, we use a limited number of real‐life measured profiles of natural surfaces. In the second method, the average surface spectrum of the measured profiles of the first method is found. With the use of the averaged spectrum, many profiles are generated, the scattering cross sections of which are calculated. In the third method, the averaged rough‐surface power spectral density found in the second method is fitted with a spectrum (e.g., power law). From the filted spectrum, many profiles are generated, and the average scattering cross section is calculated. We find that the back‐scattering levels of Method 3 and Method 1 can have differences (e.g., 6 dB). Method 2 generally gives reasonable results within 1.1 dB of Method 1. Examples are taken from soil, snow, and rock surfaces. © 1996 John Wiley & Sons, Inc.