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Transient analysis of high‐speed digital interconnects with nonuniform coupled lines
Author(s) -
Boulejfen N.,
Kouki A. B.,
Ghannouchi F. M.
Publication year - 1996
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(19960420)11:6<308::aid-mop6>3.0.co;2-n
Subject(s) - transient (computer programming) , spice , scattering parameters , electronic engineering , electrical impedance , time domain , network analysis , port (circuit theory) , scattering , transient analysis , characteristic impedance , computer science , engineering , transient response , electrical engineering , physics , optics , computer vision , operating system
A formulation for the transient analysis of high‐speed digital interconnects with the use of generalized time‐domain scattering parameters is presented. The scattering parameters can represent any arbitrary. N‐port passive network under an arbitrary impedance reference system and an even be obtained from measurements. A procedure for converting parameters between different impedance reference systems is also given. Finally, simulation results are presented and compared to those obtained with a SPICE simulator. © 1996 John Wiley & Sons, Inc.