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TR de‐embedding method with the use of the time‐domain option
Author(s) -
Paunoviĉ D.,
Benson T. M.
Publication year - 1996
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/(sici)1098-2760(199603)11:4<175::aid-mop2>3.0.co;2-h
Subject(s) - scattering parameters , embedding , calibration , microstrip , microwave , time domain , coaxial , electronic engineering , characterization (materials science) , scattering , domain (mathematical analysis) , computer science , physics , engineering , mathematics , electrical engineering , optics , mathematical analysis , telecommunications , artificial intelligence , computer vision , quantum mechanics
The experimental characterization of the scattering parameters of a device with non‐coaxial terminations is a fundamental problem in microwave measurements. A new method for measuring these parameters using a time‐domain de‐embedding technique is presented. Two measurements provide the required S‐parameter evaluation and no additional calibration standards are necessary. Illustrative results for a microstrip‐coaxial line transition are given. © 1996 John Wiley & Sons, Inc.