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X‐ray photoelectron spectroscopy of polybithiophene–polystyrene composites
Author(s) -
Samir F.,
Morsli M.,
Bernède J. C.,
Bonnet A.,
Lefrant S.
Publication year - 1997
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/(sici)1097-4628(19971205)66:10<1839::aid-app1>3.0.co;2-o
Subject(s) - x ray photoelectron spectroscopy , polystyrene , materials science , analytical chemistry (journal) , electron microprobe , polymerization , electron spectroscopy , conductivity , electrical resistivity and conductivity , spectroscopy , composite number , polymer chemistry , chemistry , composite material , chemical engineering , polymer , organic chemistry , physics , quantum mechanics , engineering , electrical engineering , metallurgy
An investigation of the structure, stability, and charge distributions of conducting polybithiophene–polystyrene composite chemically synthetized using X‐ray photoelectron spectroscopy (XPS) and electron microprobe analysis is described. XPS results confirm the reduction of the oxidant (Fe 3+ is reduced to Fe 2+ and Cu 2+ to Cu + ) during the bithiophene polymerization and indicate that the positive charges of doped polybithiophene are preferentially localized on the carbon atoms. Measurements versus ambient atmosphere exposure support a decreasing of the atomic ratio Cl/Fe or Cl/Cu and an increasing of the atomic ratio O/C, which could be responsible for the observed electrical conductivity instability. © 1997 John Wiley & Sons, Inc. J Appl Polym Sci 66: 1839–1845, 1997