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PIXE analysis of silk
Author(s) -
Liu Yongcheng,
Yu Tongyin,
Yao Huiying,
Yang Fujia
Publication year - 1997
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/(sici)1097-4628(19971010)66:2<405::aid-app21>3.0.co;2-v
Subject(s) - silk , polymer science , materials science , polymer chemistry , proton , analytical chemistry (journal) , composite material , chemistry , physics , environmental chemistry , nuclear physics
The method of proton‐induced X‐ray emission (PIXE) was first utilized to analyze the elements in silk. Different kinds of silk from home and the wild were examined. The results show that every silk, besides C, H, O, and N, contains many types of elements such as Si, P. S, Ca, Mn, Fe, Cu, Zn, and Sr and different samples have different relative contents. © 1997 John Wiley & Sons, Inc. J Appl Polym Sci 66: 405–408, 1997