Premium
Near‐field FTIR imaging: A technique for enhancing spatial resolution in FTIR microscopy
Author(s) -
Sahlin Jennifer J.,
Peppas Nikolaos A.
Publication year - 1997
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/(sici)1097-4628(19970103)63:1<103::aid-app10>3.0.co;2-6
Subject(s) - fourier transform infrared spectroscopy , characterization (materials science) , fourier transform , microscopy , resolution (logic) , materials science , image resolution , analytical chemistry (journal) , infrared microscopy , infrared , optics , nanotechnology , chemistry , computer science , physics , chromatography , artificial intelligence , quantum mechanics
Fourier transform infrared (FTIR) microscopy is a powerful analytical technique for characterization of polymeric materials. In certain applications, however, it would be advantageous to obtain higher spatial resolution than what is presently feasible. This contribution reviews the key principles of FTIR microscopy and presents a design enhancement that increases the spatial resolution that may be obtained with a standard FTIR microscope. Representative results are shown, which illustrate the technique's effectiveness. © 1997 John Wiley & Sons, Inc.