Premium
Simple on‐line X‐ray setup to monitor structural changes during fiber processing
Author(s) -
Hsiao Benjamin S.,
Barton Randolph,
Quintana John
Publication year - 1996
Publication title -
journal of applied polymer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.575
H-Index - 166
eISSN - 1097-4628
pISSN - 0021-8995
DOI - 10.1002/(sici)1097-4628(19961219)62:12<2061::aid-app9>3.0.co;2-f
Subject(s) - spinning , diffraction , materials science , line (geometry) , fiber , optics , x ray , fiber diffraction , synchrotron , detector , crystal (programming language) , orientation (vector space) , x ray crystallography , composite material , physics , computer science , geometry , mathematics , programming language
We demonstrate that on‐line X‐ray characterization during fiber processing can be carried out using a low‐power X‐ray generator and an image plate detector. Two fiber processes using 66‐nylon were chosen as examples: high‐temperature drawing at different ratios (3.5–5.0 X) and melt spinning at moderate speeds (450 and 1,200 mpm). For the draw measurement, useful diffraction images were obtained in a reasonable time frame (30 min). These patterns were equal in quality to static in‐laboratory images and sufficient for quantitative analysis. Results showed significant differences in structure between on‐line and off‐package samples. The crystal density was found to be lower but the crystal orientation was found to be higher as draw ratio increases. The on‐line spinning image was found to be similar to those obtained by synchrotron X‐ray measurements, which confirm the development of two‐dimensional crystals having a hydrogen bonding characteristic distance during spinning. Finally, several ways to improve the demonstrated on‐line setup design will be discussed. © 1996 John Wiley & Sons, Inc.