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Resonance Raman intensity analysis investigation of metal–metal bonded transitions: an examination of the 1 A 2 u ← 1 A 1 g (5dσ * → 6pσ) transition of Pt 2 (P 2 O 5 H 2 ) 4 4−
Author(s) -
Leung King Hung,
Phillips David Lee,
Che ChiMing,
Miskowski Vincent M.
Publication year - 1999
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/(sici)1097-4555(199911)30:11<987::aid-jrs471>3.0.co;2-3
Subject(s) - raman spectroscopy , chemistry , excited state , resonance (particle physics) , resonance raman spectroscopy , transition metal , metal , ground state , absorption (acoustics) , analytical chemistry (journal) , molecular electronic transition , intensity (physics) , acetonitrile , bond length , molecule , atomic physics , crystallography , crystal structure , materials science , optics , biochemistry , physics , organic chemistry , chromatography , composite material , catalysis
A preliminary resonance Raman intensity analysis study of the 1 A 2 u ← 1 A 1 g (5dσ * → 6pσ) transition of ( n ‐Bu 4 N) 4 [Pt 2 (P 2 O 5 H 2 ) 4 ] in acetonitrile solution at room temperature is reported. The absolute resonance Raman and absorption intensities were simultaneously simulated using wavepacket calculations and a simple model. The best fit parameters indicate that the Pt— Pt bond length changes by about 0.225 Å in the initially excited 1 A 2 u state relative to the ground state. This is in good agreement with previous studies on the vibronically structured absorption and emission spectra of low‐temperature crystalline ( n ‐Bu 4 N) 4 [Pt 2 (P 2 O 5 H 2 ) 4 ] which suggested that the Pt— Pt bond length changes by about 0.21 Å in the 1,3 A 2 u states. The resonance Raman intensity analysis demonstrated here can be generally applied to metal– metal bonded electronic transitions for compounds and sample conditions (such as room temperature liquids for many samples) which do not exhibit any vibronic structure. Copyright © 1999 John Wiley & Sons, Ltd.