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Near‐field Raman spectroscopy
Author(s) -
Grausem Jerôme,
Humbert Bernard,
Spajer Michel,
Courjon Daniel,
Burneau André,
Oswalt Joel
Publication year - 1999
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/(sici)1097-4555(199909)30:9<833::aid-jrs455>3.0.co;2-#
Subject(s) - raman spectroscopy , field (mathematics) , spectroscopy , materials science , analytical chemistry (journal) , nuclear magnetic resonance , chemistry , physics , optics , mathematics , quantum mechanics , organic chemistry , pure mathematics
An optical device was constructed to collect near‐field Raman spectra (NFRS) and far‐field scattering Raman spectra simultaneously on the same sasample area. In Raman applications where the studied samples do not enjoy any advantages of resonance effects, the nanoprobe may be used only as a nanodetector in order to avoid damage of the tip by the necessary laser powers. The silicon‐based samples, which are either calibrated grid or a single crystal, were studied by NFRS and conventional scattering Raman spectroscopy. The near‐field Raman signal of silicon is divided by at least four when the tip–silicon substrate distance is separated by a 100 nm layer of oxide. Moreover, between the NFR spectrum and the far‐field spectrum, on the single crystal, a shift of about 10 cm −1 is displayed. Some interpretations are discussed. These experiments confirm the potential of the NFRS already emphasized previously in the literature. Copyright © 1999 John Wiley & Sons, Ltd.