Premium
SERS spectroscopy to study adsorbates on semiconductor surfaces
Author(s) -
Quagliano Lucia G.,
Jusserand Bernard,
Orani Daniela
Publication year - 1998
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/(sici)1097-4555(199808)29:8<721::aid-jrs298>3.0.co;2-i
Subject(s) - semiconductor , raman scattering , raman spectroscopy , adsorption , materials science , molecule , analytical chemistry (journal) , spectroscopy , spectral line , chemistry , optoelectronics , optics , organic chemistry , physics , quantum mechanics , astronomy
SERS spectra were observed from molecules adsorbed on silver and on various semiconductor surfaces on to which an Ag island film had been evaporated. Because of the observed spectral differences between these spectra, it could be confirmed that the observed Raman scattering arises from molecules adsorbed on semiconductors and not on the Ag film. With this method, Raman scattering from the surface of the semiconductors is enhanced because the discontinuous Ag film produces a large electromagnetic enhancement at each Ag particle. Therefore, the surface sensitivity of the SERS effect at metal surface was used to study molecules adsorbed on the semiconductors. It was not possible to detect Raman scattering from surfaces without the deposited Ag film because the vibrational spectra of molecules adsorbed on the semiconductor surfaces were too weak to be detected. These results prove that adsorbed species on semiconductor surface can be detected by SERS spectroscopy by coating the surface with a discontinuous Ag film. © 1998 John Wiley & Sons, Ltd.