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Estimation of Slit Width from Observed Raman Spectra
Author(s) -
Singh Ranjan K.,
Verma A. L.
Publication year - 1997
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/(sici)1097-4555(199705)28:5<301::aid-jrs94>3.0.co;2-w
Subject(s) - raman spectroscopy , slit , spectral line , distortion (music) , spectrometer , analytical chemistry (journal) , character (mathematics) , line (geometry) , chemistry , optics , molecular physics , physics , mathematics , geometry , chromatography , quantum mechanics , amplifier , optoelectronics , cmos
A simple technique for estimating the slit width of a spectrometer from the ratio of the observed (Δν 1/2 ) R and (Δν 1/4 ) R of a Raman line profile was developed by calculating a set of corresponding values of Z =(Δν 1/4 ) R /(Δν 1/2 ) R and X = S /(Δν 1/2 ) R based on the exact numerical evaluation of the Voigt profile. This technique was applied to some selected Raman lines and was found to give accurate values of the slit width in almost all cases where the slit distortion is appreciable and the band is isolated. Another technique for calculating the fractional Lorentzian character from the observed Raman spectra is also suggested. © 1997 by John Wiley & Sons, Ltd.