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Nano‐Raman Spectroscopy and Imaging with a Near‐Field Scanning Optical Microscope
Author(s) -
Jahncke C. L.,
Hallen H. D.,
Paesler M. A.
Publication year - 1996
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/(sici)1097-4555(199608)27:8<579::aid-jrs13>3.0.co;2-4
Subject(s) - raman spectroscopy , raman microscope , microscope , optical microscope , optics , microscopy , near field scanning optical microscope , materials science , optoelectronics , chemistry , scanning electron microscope , raman scattering , physics
Raman spectroscopy was performed using a near‐field scanning optical microscope. This avoids the diffraction limit inherent in conventional optical microscopy techniques involving far‐field optical components, and allows volumes significantly smaller than the cube of the wavelength to be investigated. The small sample volume coupled with the light‐starved nature of the Raman effect itself makes such nano‐Raman studies difficult. A near‐field Raman microscope is described and results showing near‐field effects in an investigation of Rb‐doped KTP are presented. An image taken within a Raman feature demonstrates that nano‐Raman imaging is indeed possible if the near‐field instrument has considerable long‐term stability, and that several unique aspects of the near‐field data recommend this approach.