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Development of total reflection x‐ray fluorescence analysis at the Atominstitute of the Austrian Universities
Author(s) -
Streli Christina
Publication year - 2000
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(200005/06)29:3<203::aid-xrs410>3.0.co;2-p
Subject(s) - synchrotron radiation , x ray fluorescence , excitation , synchrotron , sample (material) , calibration , reflection (computer programming) , reflector (photography) , optics , total internal reflection , range (aeronautics) , analytical chemistry (journal) , fluorescence , materials science , chemistry , physics , light source , computer science , chromatography , quantum mechanics , composite material , programming language
Total reflection x‐ray fluorescence analysis (TXRF) has been developed systematically at the Atominstitute from 1974 continuously up to the present. It is now an internationally accepted and applied method of trace element analysis by energy‐dispersive XRF in a special excitation mode competing with ICP‐MS. The detection limits are in the picograms range, approaching the femtogram level using synchrotron radiation. Small sample masses are required to determine simultaneously a wide range of elements. The thin sample is placed on the smooth polished surface of a reflecting sample carrier, and a precise calibration can be performed easily. The historical development of Atominstitute activities is reported, together with the development of spectral modification elements and various sample reflector materials. Extension to detect low‐ and high‐ Z elements by K‐shell excitation and the use of various excitation sources such as rotating anode tubes, special x‐ray tubes and synchrotron radiation are described. Copyright © 2000 John Wiley & Sons, Ltd.