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Synchrotron radiation x‐ray excited optical luminescence for chemical state selective analysis
Author(s) -
Hayakawa Shinjiro,
Hirose Takehide,
Yan Liang,
Morishita Makoto,
Kuwano Hiroaki,
Gohshi Yohichi
Publication year - 1999
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199911/12)28:6<515::aid-xrs380>3.0.co;2-n
Subject(s) - synchrotron radiation , luminescence , x ray absorption fine structure , excited state , scintillator , materials science , fluorescence , absorption (acoustics) , synchrotron , analytical chemistry (journal) , x ray , chemistry , spectral line , absorption spectroscopy , optics , optoelectronics , atomic physics , spectroscopy , physics , quantum mechanics , chromatography , detector , composite material , astronomy
The analytical feasibility of x‐ray excited optical luminescence (XEOL) was examined using synchrotron radiation. Decay spectra of XEO of XEOL from a plastic scintillator and Y 3 Al 5 O 12 :Ce were measured using single bunch operation of the storage ring, and chemical state selectivity of XEOL detection was used for selective measurements of x‐ray absorption fine structure (XAFS) spectra from a mixture of ZnS and ZnO. To obtain a reliable XAFS spectrum using the XEOL yield, spectral deformation was explained with a simple model similar to those used for primary x‐ray fluorescence intensity. Copyright © 1999 John Wiley & Sons, Ltd.