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Development and application of multi‐purpose x‐ray fluorescence analyzer using synchrotron and conventional x‐ray sources
Author(s) -
Terada Yasuko,
Kondo Nahoko,
Kataoka Masaki,
Izumiyama Masaki,
Nakai Izumi,
Goto Shunji
Publication year - 1999
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199911/12)28:6<461::aid-xrs391>3.0.co;2-t
Subject(s) - x ray fluorescence , spectrum analyzer , synchrotron radiation , synchrotron , analytical chemistry (journal) , detection limit , materials science , x ray , total internal reflection , fluorescence , optics , chemistry , physics , optoelectronics , environmental chemistry , chromatography
A multi‐purpose analyzer was developed to carry out x‐ray fluorescence (XRF) analysis of micro‐samples and total reflection x‐ray fluorescence (TXRF) analysis of environmental samples using either conventional x‐ray or synchrotron radiation as an excitation source. Cosmic dust samples collected in Antarctica were successfully analyzed using a conventional x‐ray source. XRF spectra of 36 cosmic dust samples were measured automatically using a combination of specially designed software and a sample holder, and trace amounts of heavy elements (10 ppm level in the sample) were detected. The potential ability of the XRF analyzer in TXRF mode using synchrotron x‐rays from a third‐generation light source, SPring‐8, was tested using a standard river water and arsenic‐containing water as samples. Satisfactory linearity of concentration versus net intensity of As was obtained in the concentration range 100 fg–100 ng with a detection limit of 10 fg. Copyright © 1999 John Wiley & Sons, Ltd.