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Direct observation of in‐plane texture in cobalt recording media by means of a laboratory‐scale x‐ray diffractometer
Author(s) -
Omote Kazuhiko
Publication year - 1999
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199911/12)28:6<440::aid-xrs389>3.0.co;2-b
Subject(s) - diffractometer , diffraction , crystallite , materials science , texture (cosmology) , lattice constant , thin film , x ray crystallography , cobalt , crystallography , anisotropy , optics , chemistry , composite material , physics , scanning electron microscope , nanotechnology , metallurgy , computer science , image (mathematics) , artificial intelligence
A new diffractometer was developed for measuring in‐plane diffraction by employing an advanced parabolic multilayer and a rotating anode x‐ray generator. By means of the diffractometer, the in‐plane Co(002) diffraction peak and its lateral anisotropy was successfully observed in cobalt thin films of magnetic recording media, which had so far been difficult to observe with a conventional θ/2θ diffractometer. In‐plane diffraction is useful for analyzing such a lateral structure of thin films. It was possible to estimate lattice constants, crystallite size and the texture of the crystallites of cobalt thin films from the observed in‐plane diffraction data. It was found that the magnetic properties of these disks had a close relationship with the crystallographic structure of cobalt films obtained by the present in‐plane diffraction. Copyright © 1999 John Wiley & Sons, Ltd.