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Determination of impurity lattice sites in single crystals using PIXE channeling
Author(s) -
Kling A.,
Soares J. C.,
da Silva M. F.,
Rebouta L.,
Kollewe D.,
Krause H.,
Flagmeyer R.H.,
Vogt J.
Publication year - 1999
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199903/04)28:2<105::aid-xrs318>3.0.co;2-r
Subject(s) - impurity , rutherford backscattering spectrometry , lattice (music) , materials science , single crystal , analytical chemistry (journal) , crystallography , chemistry , nanotechnology , physics , thin film , organic chemistry , chromatography , acoustics
The channeling technique is an interesting and powerful tool for the determination of impurity lattice sites in single crystals. Since the investigation of light impurities in heavy matrices using the Rutherford backscattering spectrometry/channeling technique is often very difficult or impossible, the combination of particle induced x‐ray emission (PIXE) with the channeling effect is an important alternative. Experimental results for various impurities in cubic and non‐cubic crystals are presented to show the feasibility of the method. In order to permit the quantitative analysis of such PIXE/channeling data, the computer code CASSIS was developed and successfully applied. Copyright ©1999 John Wiley & Sons, Ltd.