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Characteristic x‐ray imaging by means of filters
Author(s) -
Cazaux J.
Publication year - 1999
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199901/02)28:1<9::aid-xrs299>3.0.co;2-l
Subject(s) - detector , optics , reflection (computer programming) , microanalysis , x ray , x ray detector , microscopy , electron probe microanalysis , scanning electron microscope , physics , materials science , computer science , chemistry , organic chemistry , programming language
The possibility of obtaining quasi‐analytical data with acombination of well designed filters and non‐dispersivex‐ray detectors is demonstrated with the help of simplemathematical arguments. The optimum choice for the filters isdiscussed with also the limitation of the proposed approach. Variousexperimental arrangements are suggested for taking advantage of theuse of CCD cameras for x‐ray imaging in total reflectionx‐ray fluorescence microscopy for instance, or of the use ofsingle detectors with high counting rates for a rapid 2D mapping inthe scanning electron mode of electron probe microanalysis. Copyright© 1999 John Wiley & Sons, Ltd.