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Theoretical calculations of detection limits in total reflection XRF analysis
Author(s) -
Sánchez Héctor Jorge
Publication year - 1999
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199901/02)28:1<51::aid-xrs308>3.0.co;2-o
Subject(s) - reflection (computer programming) , detection limit , total internal reflection , trace (psycholinguistics) , optics , radiation , x ray fluorescence , sample (material) , fluorescence , function (biology) , physics , beam (structure) , computational physics , chemistry , computer science , chromatography , linguistics , philosophy , evolutionary biology , biology , programming language , thermodynamics
Theoretical expressions for fluorescent intensity and scatteredradiation in total reflection experiments are presented. Traceelements in samples with different matrices were studied. Thecontributions of the different components were analyzed and acomparison with conventional x‐ray fluorescence was performed.Detection limits were calculated as a function of the samplethickness in both experimental situations. Very interestingconclusions were obtained regarding the contribution of the reflectedbeam, the components of the background and the behavior of detectionlevels. Copyright © 1999 John Wiley & Sons, Ltd.