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Application of the invariant embedding method to x‐ray microanalysis
Author(s) -
Heluani Silvia P.,
Hoffmann C.
Publication year - 1998
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199811/12)27:6<390::aid-xrs285>3.0.co;2-u
Subject(s) - microanalysis , invariant (physics) , ionization , embedding , electron probe microanalysis , electron , computational physics , physics , mathematics , optics , chemistry , scanning electron microscope , computer science , ion , mathematical physics , quantum mechanics , artificial intelligence , organic chemistry
The invariant embedding principle was applied to obtain closedanalytical expressions of several magnitudes of interest in electronprobe microanalysis [ionization distribution function,ϕ(ρ z ) backscattering probability,etc.]. This approach permits one easily to obtain solutions for amodel which explicitly considers the mean free path between effectiveelectron collisions. © 1998 John Wiley & Sons,Ltd.