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Calculation of ionization depth distributions and backscattering coefficients applying a new Monte Carlo simulation approach
Author(s) -
Wagner H. W.,
Werner W. S. M.
Publication year - 1998
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199811/12)27:6<373::aid-xrs283>3.0.co;2-t
Subject(s) - monte carlo method , formalism (music) , statistical physics , ionization , computational physics , dynamic monte carlo method , physics , momentum (technical analysis) , ion , mathematics , statistics , quantum mechanics , art , musical , finance , economics , visual arts
Most simulation methods in the literature for the calculation ofionization depth distributions Φ(ρ z ) inelectron probe microanalysis neglect energy straggling. In this work,a new Monte Carlo simulation method was applied to the calculationΦ(ρ z ) curves. This method is based on therecently developed partial intensity formalism and accounts for energystraggling through the use of an effective equation for the stochasticprocess governing multiple energy losses. The obtained simulationresults are compared with both experimental results and results ofother simulation approaches, and confirm the applicability of this newmethod for the calculation of Φ(ρ z )distributions. This comparison shows that energy straggling does notplay a significant role in the formation of theΦ(ρ z ) curve since the slowing down process isdominated by the momentum relaxation process. © 1998 John Wiley& Sons, Ltd.