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Ionization depth distribution in EPMA: improvement of the random walk model
Author(s) -
Castellano G.,
Segui S.,
Trincavelli J.
Publication year - 1998
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199809/10)27:5<293::aid-xrs270>3.0.co;2-m
Subject(s) - random walk , monte carlo method , electron microprobe , ionization , statistical physics , electron , simplicity , distribution (mathematics) , mathematics , computational physics , statistics , physics , chemistry , mathematical analysis , mineralogy , ion , nuclear physics , quantum mechanics
A model for the parameter γ involved in Packwood and Brown’s expression for the ionization depth distribution ϕ(ρ z ) in EPMA is developed. Assuming that the electrons perform a random walk within the sample, the parameter γ is related to the probability of finding an electron in the surface layer after a large number of steps. Despite the simplicity of the model, the resulting γ values produce a very good description of ϕ(ρ z ) distributions obtained through Monte Carlo simulations and experimental data. © 1998 John Wiley & Sons, Ltd.