Premium
Correction method for the matrix effect in x‐ray fluorescence spectrometric analysis
Author(s) -
Tan Binghe,
Sun Weiying
Publication year - 1998
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199803/04)27:2<95::aid-xrs257>3.0.co;2-2
Subject(s) - x ray fluorescence , matrix (chemical analysis) , fluorescence , component (thermodynamics) , sample (material) , analytical chemistry (journal) , coefficient matrix , chemistry , materials science , physics , thermodynamics , optics , chromatography , quantum mechanics , eigenvalues and eigenvectors
With the help of a fundamental parameter program, the matrix effect of multi‐component complex samples and the composition of each element’s X‐ray fluorescence intensity were calculated. A mathematical model for correcting the multi‐component matrix effect was deduced theoretically. It provides two methods for calculating theoretical influence coefficients α and β. The correction model and the influence coefficient introduced in this paper have clear and definite physical meanings. They gave satisfactory results when utilized in analyzing stainless‐steel samples. The results also indicate that the effect of tertiary fluorescence cannot be neglected in some cases. From the results of comparison experiments, it is concluded that the tertiary fluorescence effect must be taken into consideration while analyzing Cr in a steel sample with a high concentration of Ni. © 1998 John Wiley & Sons, Ltd.