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Determination of light elements using x‐ray spectrometry. Part I—Analytical implications of using scattered tube lines
Author(s) -
van Sprang Hans A.,
Bekkers Mirjan H. J.
Publication year - 1998
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199801/02)27:1<31::aid-xrs245>3.0.co;2-#
Subject(s) - x ray tube , x ray , mass spectrometry , tube (container) , optics , materials science , analytical chemistry (journal) , physics , chemistry , chromatography , electrode , anode , composite material , quantum mechanics
X‐rays scattered from a material contain information on the composition of the sample. The relationship between the sample composition and the amount of scattered radiation was studied for low‐ Z materials. Use of Compton‐scattered tubelines appears to be the preferred technique and a calibration is presented based on a set of standards of known composition. Some unexpected features are discussed and the possible use of this method for quantification is demonstrated using results from a second set of standards. © 1998 John Wiley & Sons, Ltd.