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Applications of x‐ray microfluorescence to materials analysis
Author(s) -
Havrilla George J.
Publication year - 1997
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199711/12)26:6<364::aid-xrs235>3.0.co;2-w
Subject(s) - materials science
Abstract X‐ray microfluorescence provides the analytical scientist with a powerful tool to solve a variety of materials‐based problems. Spatially resolved non‐destructive elemental analyses can rapidly address a number of problems using qualitative analysis. Point spectra, line profiles and elemental maps offer different approaches for characterization information on a wide variety of materials. Applications are presented which span customer service complaints to experimental ceramic materials to fossils. © 1997 John Wiley & Sons, Ltd.