Premium
X‐ray spectrometric applications of a synchrotron x‐ray microbeam
Author(s) -
Iida Atsuo
Publication year - 1997
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199711/12)26:6<359::aid-xrs234>3.0.co;2-l
Subject(s) - x ray absorption fine structure , microbeam , synchrotron , x ray , image resolution , characterization (materials science) , synchrotron radiation , materials science , x ray fluorescence , optics , resolution (logic) , chemical state , diffraction , analytical chemistry (journal) , chemistry , physics , fluorescence , x ray photoelectron spectroscopy , spectroscopy , nuclear magnetic resonance , computer science , quantum mechanics , chromatography , artificial intelligence
Synchrotron x‐ray microbeams with less than a few μm spatial resolution have been applied to x‐ray spectroscopic and diffraction studies. Among various x‐ray spectrometric applications, the relatively new techniques of near‐surface x‐ray fluorescence analysis and the micro x‐ray absorption fine structure (micro‐XAFS) method have been developed. For a near‐surface analysis, the grazing‐exit condition is used to enhance the surface sensitivity in addition to the lateral spatial resolution. With the micro‐XAFS technique, chemical‐state analysis over small regions and chemical‐state imaging become possible. A micro x‐ray spectrometric analysis with high spatial resolution was effectively utilized for materials characterization. © 1997 John Wiley & Sons, Ltd.