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Applications of synchrotron radiation‐induced x‐ray emission (SRIXE)
Author(s) -
Jones K. W.,
Berry W. J.,
Borsay D. J.,
Cline H. T.,
Conner W. C.,
Fullmer C. S.
Publication year - 1997
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199711/12)26:6<350::aid-xrs233>3.0.co;2-e
Subject(s) - synchrotron radiation , synchrotron , national laboratory , bremsstrahlung , x ray , materials science , optics , physics , engineering physics , photon
Synchrotron radiation‐induced x‐ray emission (SRIXE) is now a proven analytical method for the determination of trace elements. It is notable for spatial resolutions of less than 10 μm and minimum detection limits that can be as low as 1 ppm by weight. The approach to SRIXE measurements in use at the Brookhaven National Synchrotron Light Source is summarized to illustrate the experimental approach to SRIXE. Application of SRIXE to several different questions are then discussed. The particular examples presented deal with the detection of trace amounts of (1) toxic metals in marine worms, tadpole brains and chick tibia and (2) catalysts in polyolefin polymerization particles. © 1997 John Wiley & Sons, Ltd.