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Modifications to a Multiple Scattering Monte Carlo Model to Predict X‐Ray Generation Curves
Author(s) -
Chan A.,
Brown J. D.
Publication year - 1997
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199709)26:5<275::aid-xrs206>3.0.co;2-p
Subject(s) - monte carlo method , scattering , statistical physics , physics , homogeneous , computational physics , dynamic monte carlo method , mathematics , optics , statistics
Quantitative analysis of homogeneous bulk unknowns using an electron probe microanalyser requires the accurate knowledge of the depth distribution of x‐ray production [ϕ(ρ z ) curves]. Linear behaviour is observed in the plot of lnϕ(ρ z ) vs . (ρ z ) 2 beyond the peak value for most experimentally measured data. However, lnϕ(ρ z ) vs . (ρ z ) 2 plots of Monte Carlo simulated ϕ(ρ z ) curves, in general, are non‐linear and concave downwards. By introducing the concept of electron straggling into a multiple scattering Monte Carlo model, agreement with the behaviour of the experimental curves is achieved. © 1997 John Wiley & Sons, Ltd.