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Comparison of Grazing Emission XRF with Total Reflection XRF and Other X‐Ray Emission Techniques
Author(s) -
Claes Martine,
Van Grieken René,
de Bokx Pieter
Publication year - 1997
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199707)26:4<153::aid-xrs195>3.0.co;2-1
Subject(s) - x ray fluorescence , sample (material) , analytical chemistry (journal) , reflection (computer programming) , optics , materials science , fluorescence , physics , chemistry , computer science , environmental chemistry , chromatography , programming language
A preliminary comparison of a new x‐ray fluorescence (XRF) technique, grazing emission x‐ray fluorescence (GEXRF), with several other XRF techniques is described, based on previous experiments and literature. These techniques are total reflection XRF, conventional energy‐dispersive XRF, wavelength‐dispersive XRF and particle‐induced x‐ray emission. The comparison is done from a number of viewpoints, including preferred sample type and size, multi‐element determination, interferences, accuracy, detection limits and cost of instruments. Different analytical procedures for aqueous solutions between these techniques are indicated. Particular emphasis is placed on the position of the GEXRF technique, and it is indicated for what sample types and/or analytical problems GEXRF will offer significant advantages over the other techniques. © 1997 John Wiley & Sons, Ltd.