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Energy‐Dispersive X‐Ray Fluorescence Analysis in Geochemical Mapping
Author(s) -
Civici Nikolla,
Van Grieken René
Publication year - 1997
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199707)26:4<147::aid-xrs193>3.0.co;2-x
Subject(s) - pellets , x ray fluorescence , excitation , analytical chemistry (journal) , fluorescence , certified reference materials , mineralogy , sediment , sample preparation , materials science , chemistry , geology , environmental chemistry , detection limit , physics , optics , composite material , chromatography , paleontology , quantum mechanics
The benefits of using energy‐dispersive X‐ray fluorescence analysis (EDXRF) for geochemical mapping projects are described. Thick pellets of geochemical samples, soil and sediment were measured in a secondary target excitation EDXRF system, using Mn and Mo secondary targets for excitation of low‐ and medium‐ Z elements, respectively. Ba and some rare earth elements were determined using an Am‐241 source. A fundamental parameter approach and the program COREX were used for calculating the concentrations. Depending on the composition of the sample, 20–30 elements could be determined. The precision and accuracy of the method were evaluated by repeated analyses of a series of standard reference materials recommended for use as primary standards in geo‐chemical mapping. In most cases, the results showed good agreement with the certified values, i.e. the data were within recommended limits. © 1997 John Wiley & Sons, Ltd.