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Applications of Glancing Incidence X‐Ray Analysis
Author(s) -
Leenaers A. J. G.,
de Boer D. K. G.
Publication year - 1997
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199705)26:3<115::aid-xrs219>3.0.co;2-y
Subject(s) - characterization (materials science) , x ray fluorescence , x ray , optics , materials science , reflectivity , incidence (geometry) , fluorescence , physics
In many technological applications layered materials have an increasing importance. Almost complete characterization of such materials can be achieved with glancing incidence x‐ray analysis (GIXA). Within this technique, x‐ray reflectivity and angle‐dependent x‐ray fluorescence measurements are combined, resulting in a structural and chemical analysis of the samples. © 1997 by John Wiley & Sons, Ltd.