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Particle‐Induced X‐Ray Emission Spectrometry (PIXE) Edited by SVEN A. E. JOHANSSON, JOHN L. CAMPBELL and KLAS G. MALMQVIST Wiley–Interscience, New York, 1995
Author(s) -
NAGEL D. J.
Publication year - 1997
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199701)26:1<49::aid-xrs185>3.0.co;2-l
Subject(s) - citation , library science , physics , computer science