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Application of the Pontriaguin Method to a Simple Model for Electron Probe Microanalysis
Author(s) -
Villafuerte M.,
Heluani S.,
Brizuela H.,
Hoffmann C.
Publication year - 1997
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199701)26:1<3::aid-xrs177>3.0.co;2-k
Subject(s) - simple (philosophy) , microanalysis , electron probe microanalysis , electron , cathode ray , line (geometry) , atomic physics , analytical chemistry (journal) , computational physics , physics , chemistry , optics , materials science , nuclear physics , mathematics , chromatography , scanning electron microscope , philosophy , geometry , organic chemistry , epistemology
An analytical expression for the characteristic line intensity of the x‐rays emitted by a probe when bombarded by an electron beam is obtained using the Pontriaguin method. This method is applied to a simple model which is briefly described. © 1997 by John Wiley & Sons, Ltd.