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Direct Determination Method for Homogeneous Solid Samples in X‐Ray Fluorescence Analysis
Author(s) -
Wang Yongzhong
Publication year - 1996
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199609)25:5<245::aid-xrs166>3.0.co;2-t
Subject(s) - homogeneous , substrate (aquarium) , materials science , sample (material) , x ray fluorescence , analytical chemistry (journal) , thin film , coating , thin layer , layer (electronics) , optics , fluorescence , chemistry , nanotechnology , chromatography , physics , thermodynamics , oceanography , geology
The concept and theory of a direct determination method (DD method) and the procedure for carrying out the DD method for homogeneous solid samples are presented. The theory presented is general for homogeneous solid samples. A thin‐film sample, single layer on a substrate, coating multi‐layer on a substrate and bulk sample (including pieces, powder and fragments) can be regarded as special cases of the application of the theory. A practical application to 12 commercial iron‐based spray powder samples was studied and experimental data from literature were used to calculate the composition and thickness of thin‐film samples with the DD method. The analytical expressions of intensities of de Boer and Brouwer were modified and applied to the DD method. Two independent computer programs, written in BASIC, were used to calculate the numerical values for bulk and thin‐film samples. It is reasonable to expect that a common computer program for the DD method will soon be developed and will be applied to all sorts of homogeneous solid samples without specific sample preparation.