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Elemental Analysis by Radioisotope‐Excited XRF During Thermit Smelting of Ferrovanadium and Niobium
Author(s) -
Sharma I. G.,
Bose D. K.,
Joseph Daisy,
Lal Madan
Publication year - 1996
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199609)25:5<205::aid-xrs160>3.0.co;2-e
Subject(s) - niobium , smelting , x ray fluorescence , analytical chemistry (journal) , elemental analysis , trace (psycholinguistics) , microanalysis , excited state , chemistry , materials science , metallurgy , fluorescence , environmental chemistry , atomic physics , inorganic chemistry , physics , optics , organic chemistry , linguistics , philosophy
The energy‐dispersive x‐ray fluorescence (EDXRF) technique was applied to the determination of major and trace elements present in aluminothermically smelted ferrovanadium and niobium. Rapid and multielemental analysis of thermit feed and product aided in the appropriate alterations of the charge constituents to obtain the optimum charge composition. The results of analysis by the EDXRF method were verified using wet chemical analysis for a few typical samples of the product and were found to be in close agreement.