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Indirect Method of X‐Ray Spectra Determination by XRF
Author(s) -
Mainardi Raúl T.,
Barrea Raúl A.
Publication year - 1996
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199607)25:4<190::aid-xrs164>3.0.co;2-g
Subject(s) - spectrometer , spectral line , range (aeronautics) , optics , wavelength , x ray fluorescence , spectral shape analysis , energy (signal processing) , computational physics , physics , analytical chemistry (journal) , materials science , fluorescence , chemistry , chromatography , quantum mechanics , astronomy , composite material
An approach to determining the spectral shape of x‐ray tube emission is derived, relying on the measurement of the x‐ray fluorescence intensities from pure elements under standard operating conditions of a spectrometer. A model is proposed for the spectral shape consisting of three parameters, their values being obtained from the solution of a system of non‐linear equations. The methodology was applied to an energy‐dispersive spectrometer but it can also be straightforwardly adapted to a wavelength‐dispersive spectrometer. Computer simulations were carried out to check the range of application of the proposed method; the measurements made on the spectrometer were in excellent agreement with calculations.