Premium
Simple Model for Surface Ionization in Electron Probe Microanalysis
Author(s) -
Segui S.,
Trincavelli J.,
Castellano G.,
Riveros J.
Publication year - 1996
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/(sici)1097-4539(199605)25:3<110::aid-xrs141>3.0.co;2-3
Subject(s) - ionization , simple (philosophy) , microanalysis , electron , basis (linear algebra) , atomic physics , surface (topology) , distribution (mathematics) , computational physics , electron probe microanalysis , physics , materials science , chemistry , optics , mathematics , nuclear physics , scanning electron microscope , mathematical analysis , ion , geometry , quantum mechanics , philosophy , organic chemistry , epistemology
A new model for surface ionization ϕ(0) was developed from a theoretical basis approximating the energetic distribution of backscattered electrons by a delta distribution in the interval [1, U 0 ]. The expression obtained is compared with other models and with a set of experimental data.