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Combinatorial materials synthesis and high‐throughput screening: An integrated materials chip approach to mapping phase diagrams and discovery and optimization of functional materials
Author(s) -
Xiang X.D.
Publication year - 1999
Publication title -
biotechnology and bioengineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.136
H-Index - 189
eISSN - 1097-0290
pISSN - 0006-3592
DOI - 10.1002/(sici)1097-0290(1998)61:4<227::aid-cc5>3.0.co;2-f
Subject(s) - phase diagram , materials science , dielectric , throughput , microwave , nanotechnology , phase (matter) , ferroelectricity , chip , computer science , optoelectronics , chemistry , telecommunications , organic chemistry , wireless
Combinatorial materials synthesis methods and high‐throughput evaluation techniques have been developed to accelerate the process of materials discovery and optimization and phase‐diagram mapping. Analogous to integrated circuit chips, integrated materials chips containing thousands of discrete different compositions or continuous phase diagrams, often in the form of high‐quality epitaxial thin films, can be fabricated and screened for interesting properties. Microspot x‐ray method, various optical measurement techniques, and a novel evanescent microwave microscope have been used to characterize the structural, optical, magnetic, and electrical properties of samples on the materials chips. These techniques are routinely used to discover/optimize and map phase diagrams of ferroelectric, dielectric, optical, magnetic, and superconducting materials. © 1999 John Wiley & Sons, Inc. Biotechnol Bioeng (Comb Chem) 61:227–241, 1998/1999.