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Characterization of combinatorially designed polyarylates by time‐of‐flight secondary ion mass spectrometry
Author(s) -
Belu Anna M.,
Brocchini Stephen,
Kohn Joachim,
Ratner Buddy D.
Publication year - 2000
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/(sici)1097-0231(20000415)14:7<564::aid-rcm910>3.0.co;2-0
Subject(s) - chemistry , mass spectrometry , mass spectrum , time of flight , ion , characterization (materials science) , quadrupole time of flight , secondary ion mass spectrometry , analytical chemistry (journal) , chromatography , organic chemistry , nanotechnology , tandem mass spectrometry , materials science
A series of 16 polyarylates, with well‐controlled and systematically varying chemistry, has been characterized by time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS). The polymers are structurally identical except for the incremental additions of C 2 H 4 units to the backbone and sidechain. From the spectra, peaks characteristic of all polyarylates are identified. Furthermore, evaluation of the spectra and identification of unique signals allow classification of the polyarylates according to sidechain and backbone chemistry. Copyright © 2000 John Wiley & Sons, Ltd.