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Secondary ion yields produced by keV atomic and polyatomic ion impacts on a self‐assembled monolayer surface
Author(s) -
Harris R. D.,
Baker W. S.,
Van Stipdonk M. J.,
Crooks R. M.,
Schweikert E. A.
Publication year - 1999
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/(sici)1097-0231(19990730)13:14<1374::aid-rcm645>3.0.co;2-5
Subject(s) - chemistry , polyatomic ion , ion , monolayer , organic chemistry , biochemistry
A suite of keV polyatomic or ‘cluster’ projectiles was used to bombard unoxidized and oxidized self‐assembled monolayer surfaces. Negative secondary ion yields, collected at the limit of single ion impacts, were measured and compared for both molecular and fragment ions. In contrast to targets that are orders of magnitude thicker than the penetration range of the primary ions, secondary ion yields from polyatomic projectile impacts on self‐assembled monolayers show little to no enhancement when compared with monatomic projectiles at the same velocity. This unusual trend is most likely due to the structural arrangement and bonding characteristics of the monolayer molecules with the Au(111). Copyright © 1999 John Wiley & Sons, Ltd.