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Negative‐ion low‐temperature fast‐atom bombardment mass spectrometry of monomeric and dimeric [60]fullerene compounds
Author(s) -
Gross Jürgen H.,
Giesa Sabine,
Krätschmer Wolfgang
Publication year - 1999
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/(sici)1097-0231(19990515)13:9<815::aid-rcm572>3.0.co;2-l
Subject(s) - chemistry , fast atom bombardment , mass spectrum , fragmentation (computing) , monomer , mass spectrometry , fullerene , ion , analytical chemistry (journal) , polyatomic ion , sulfuric acid , inorganic chemistry , chromatography , organic chemistry , polymer , computer science , operating system
Negative‐ion low‐temperature fast‐atom bombardment mass spectrometry (LT‐FAB‐MS) is applied to monomeric and dimeric [60]fullerene compounds. LT‐FAB mass spectra of C 60 , C 60 O 1–3 , C 119 , C 120 , C 120 O, C 120 O 2 (B) and C 120 OS exhibit clear molecular ion peaks and a moderate level of fragmentation if a 10:1 mixture of 1‐chloronaphthalene and 3‐nitrobenzyl alcohol is employed as matrix. By application of a dual‐target FAB probe and of concentrated sulfuric acid as internal mass standard elemental compositions can be derived from high‐resolution LT‐FAB mass spectra. Copyright © 1999 John Wiley & Sons, Ltd.