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Secondary ion mass spectrometry investigation of liquid gallium recovery
Author(s) -
Zakourdaev I. V.,
Tolstogouzov A. B.,
Gnido V. F.,
Kitaeva T. I.
Publication year - 1998
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/(sici)1097-0231(19981015)12:19<1356::aid-rcm307>3.0.co;2-c
Subject(s) - chemistry , gallium , tin , impurity , mass spectrometry , secondary ion mass spectrometry , analytical chemistry (journal) , chromatography , organic chemistry
The purpose of our work is to develop Secondary Ion Mass Spectrometry for routine trace element analysis; this paper demonstrates one of several applications of this method in monitoring the liquid gallium chemical regeneration process. Two groups of gallium samples with similar concentrations of impurities, but rather different Sn quantities were investigated. Samples with trace contents of tin were successively cleaned by standard chemical procedures including filtration, dipping in boiling water and acid washing. To study further the gallium/tin mixture it was necessary to study the reclamation of Ga with a large Sn concentration, because tin concentrated with other impurities onto the metal surface (‘surface impurity cementation’). Theoretical calculations for the minimum content of Sn and In in the gallium, after chemical cleaning, were conducted. Good agreement between theoretical and experimental results was obtained. © 1998 John Wiley & Sons, Ltd.