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Time‐of‐flight static secondary ion mass spectrometry analysis of surface contamination on Pt/Ir standard mass material
Author(s) -
Chakraborty Bibhash R.,
Lehman Daniel E.,
Winograd Nicholas
Publication year - 1998
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/(sici)1097-0231(19980930)12:18<1261::aid-rcm322>3.0.co;2-#
Subject(s) - chemistry , secondary ion mass spectrometry , static secondary ion mass spectrometry , mass spectrometry , contamination , ion mobility spectrometry–mass spectrometry , time of flight , ion , analytical chemistry (journal) , chromatography , selected reaction monitoring , tandem mass spectrometry , organic chemistry , ecology , biology
Static time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) has been used to characterize surface contaminants on a Pt–10% Ir alloy sample prescribed for fabrication of a prototype kilogram mass standard. The identification of various oxygenated and non‐oxygenated hydrocarbon adsorbates on the Pt–Ir surface provides a scenario for the increase in mass observed after standard cleaning procedures, and as a function of time. Static TOF‐SIMS analysis suggests the catalytic activity of Pt plays a key role in the adsorption of organic solvents used in standard cleaning procedures as well as adsorption of hydrocarbon species present in ambient laboratory air. © 1998 John Wiley & Sons, Ltd.