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Time‐of‐flight‐secondary ion mass spectrometry of NaBF 4 : a comparison of atomic and polyatomic primary ions at constant impact energy
Author(s) -
Van Stipdonk M. J.,
Harris R. D.,
Schweikert E. A.
Publication year - 1997
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/(sici)1097-0231(19971030)11:16<1794::aid-rcm79>3.0.co;2-l
Subject(s) - polyatomic ion , chemistry , ion , projectile , atomic physics , mass spectrometry , analytical chemistry (journal) , primary (astronomy) , yield (engineering) , time of flight mass spectrometry , ionization , thermodynamics , physics , chromatography , organic chemistry , quantum mechanics , astronomy
(CsI) n Cs + projectiles, n =0–3, were used to bombard a NaBF 4 (sodium tetrafluoroborate) target at the limit of single ion impacts. The relative yields of ions sputtered from the target were measured and are compared as a function of the number of atoms in the primary ion. When normalized to the mass of the primary ion, sputtered ions that do not resemble the original sample composition, (NaF) n F − , increase in yield as the primary ion complexity increases. The yields of atomic species and polyatomic ions emitted presumably as intact units decrease as the projectile complexity increases. © 1997 John Wiley & Sons, Ltd.