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Secondary Electron Emission Yields from a CsI Surface Under Impacts of Large Molecules at Low Velocities (5 × 10 3 −7 × 10 4 ms −1 )
Author(s) -
Brunelle A.,
Chaurand P.,
DellaNegra S.,
Le Beyec Y.,
Parilis E.
Publication year - 1997
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/(sici)1097-0231(19970228)11:4<353::aid-rcm865>3.0.co;2-4
Subject(s) - chemistry , electron ionization , ion , ionization , electron , mass spectrometry , atomic physics , analytical chemistry (journal) , desorption , polyatomic ion , nuclear physics , physics , chromatography , organic chemistry , adsorption
The yields of electron emission from a CsI surface bombarded with very heavy molecular ions have been measured by coincidence counting in time‐of‐flight mass spectrometry. These ions were produced by the matrix‐assisted laser desorption/ionization technique. The masses ranged from 700 to 66 000 Da with velocities V between 5 × 10 3 and 7 × 10 4 ms −1 . An electron emission rate of a few per cent was measured for the smaller impact velocities. The variations of the electron yields with mass and velocity are compared to previous data and analysed by different models. A sublinear mass dependence is observed as well as a V 4 dependence at low velocity. © 1997 John Wiley & Sons, Ltd.