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A method for fault diagnosis in linear electronic circuits
Author(s) -
Tadeusiewicz M.,
Korzybski M.
Publication year - 2000
Publication title -
international journal of circuit theory and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.364
H-Index - 52
eISSN - 1097-007X
pISSN - 0098-9886
DOI - 10.1002/(sici)1097-007x(200005/06)28:3<245::aid-cta103>3.0.co;2-x
Subject(s) - fault (geology) , node (physics) , electronic circuit , basis (linear algebra) , linear circuit , computer science , voltage , identification (biology) , electronic engineering , algorithm , control theory (sociology) , topology (electrical circuits) , engineering , mathematics , equivalent circuit , electrical engineering , artificial intelligence , botany , geometry , structural engineering , seismology , biology , geology , control (management)
A method for fault location and parameter identification in linear AC and DC circuits with limited accessible terminals for excitation and measurement is developed in this paper. Fault location is based on a derived relationship having a general meaning. It requires analyses of the circuit with nominal parameters and distinct excitations as well as measurements of some node voltages in the circuit with perturbed parameters. The fault parameter is identified using a formula obtained on the basis of the Woodbury expression. A decomposition technique is suggested enabling us to apply the method for multiple fault diagnosis. Several numerical examples illustrate the proposed approach and show its effectiveness. Copyright © 2000 John Wiley & Sons, Ltd.