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Exit wave reconstructions using through focus series of HREM images
Author(s) -
Zandbergen Henny W.,
Van Dyck Dirk
Publication year - 2000
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/(sici)1097-0029(20000501)49:3<301::aid-jemt8>3.0.co;2-r
Subject(s) - focus (optics) , interpretability , series (stratigraphy) , optics , resolution (logic) , high resolution , electron microscope , physics , computer science , artificial intelligence , geology , remote sensing , paleontology
The through focus exit wave reconstruction technique uses a series of high resolution electron microscopy images to reconstruct the complex electron wavefunction at the exit plane of the specimen. The feasibility of the through focus exit wave reconstruction method and its most important limitations are discussed. It is shown that—provided all aberrations of the microscope are well corrected for—a large improvement in the interpretability of the information can be obtained. Microsc. Res. Tech. 49:301–323, 2000. © 2000 Wiley‐Liss, Inc.