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Electron detection characteristics of a slow‐scan CCD camera, imaging plates and film, and electron image restoration
Author(s) -
Zuo J. M.
Publication year - 2000
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/(sici)1097-0029(20000501)49:3<245::aid-jemt4>3.0.co;2-o
Subject(s) - optics , detector , physics , materials science , electron , resolution (logic) , electron diffraction , cathode ray , diffraction , computer science , artificial intelligence , quantum mechanics
Electron detection characteristics are summarized for the slow scan CCD (SSC) camera, imaging plates, and film. The advantage of each detector is demonstrated with the selected examples of electron diffraction and imaging. The Richardson‐Lucy algorithm for image restoration is described and tested for images recorded with the SSC camera. The effectiveness of image restoration is demonstrated for the recorded high‐resolution lattice image, energy‐loss spectrum, and convergent beam electron diffraction (CBED) pattern. Microsc. Res. Tech. 49:245–268, 2000. © 2000 Wiley‐Liss, Inc.