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Measurement of crystal thickness and crystal tilt from HRTEM images and a way to correct for their effects
Author(s) -
Hovmöller Sven,
Zou Xiaodong
Publication year - 1999
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/(sici)1097-0029(19990801)46:3<147::aid-jemt1>3.0.co;2-1
Subject(s) - high resolution transmission electron microscopy , tilt (camera) , crystal (programming language) , materials science , optics , zone axis , transmission electron microscopy , resolution (logic) , wedge (geometry) , diffraction , electron diffraction , physics , geometry , mathematics , artificial intelligence , computer science , programming language
The effects of thickness and tilt angle are studied numerically on experimental high‐resolution transmission electron microscope (HRTEM) images of a wedge‐shaped metal oxide crystal. For sufficiently thin and well‐aligned crystals, the amplitudes and phases of the Fourier transforms of the HRTEM images are essentially the same as the crystallographic structure factors. For tilted crystals, the changes of amplitudes and phases as a function of increased thickness and tilt angle can be described by a simple model. A method is presented by which the local thickness can be determined from one HRTEM image and one convergent‐beam electron diffraction pattern from the same crystal. It is also shown how the projected potential can be reconstructed from HRTEM images of tilted crystals, disclosing the crystal structure, even from quite thick (>20 nm) samples. Microsc. Res. Tech. 46:147–159, 1999. © 1999 Wiley‐Liss, Inc.