Premium
Controlled environment transmission electron microscopy
Author(s) -
Robertson Ian M.,
Teter D.
Publication year - 1998
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/(sici)1097-0029(19980915)42:4<260::aid-jemt5>3.0.co;2-u
Subject(s) - electron microscope , transmission electron microscopy , conventional transmission electron microscope , high resolution transmission electron microscopy , electron tomography , scanning confocal electron microscopy , scanning transmission electron microscopy , energy filtered transmission electron microscopy , materials science , electron , nanotechnology , resolution (logic) , transmission (telecommunications) , optics , computer science , physics , artificial intelligence , nuclear physics , telecommunications
The design of a controlled environment electron microscope is described and examples are presented to demonstrate the information that can be obtained by studying gas‐solid interactions in real time and at high spatial resolution. Miscrosc. Res. Tech. 42:260–269, 1998. © 1998 Wiley‐Liss, Inc.